Cluster Secondary Ion Mass Spectrometry: Principles and by Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A.

By Dominic M. Desiderio, Nico M. M. Nibbering, Joseph A. Loo(eds.)

Explores the impression of the newest breakthroughs in cluster SIMS technology

Cluster secondary ion mass spectrometry (SIMS) is a excessive spatial answer imaging mass spectrometry procedure, that are used to symbolize the 3-dimensional chemical constitution in advanced natural and molecular platforms. it really works by utilizing a cluster ion resource to sputter desorb fabric from a superb pattern floor. ahead of the arrival of the cluster resource, SIMS was once significantly restricted in its skill to symbolize delicate samples because of harm from the atomic resource. Molecular samples have been primarily destroyed in the course of research, proscribing the method's sensitivity and precluding compositional intensity profiling. using new and rising cluster ion beam applied sciences has all yet eradicated those barriers, permitting researchers to go into into new fields as soon as thought of unimaginable by way of the SIMS procedure.

With contributions from major mass spectrometry researchers around the globe, Cluster Secondary Ion Mass Spectrometry: ideas and Applications describes the most recent breakthroughs in instrumentation, and addresses top practices in cluster SIMS research. It serves as a compendium of information on natural and polymeric floor and in-depth characterization utilizing cluster ion beams. It covers subject matters starting from the basics and thought of cluster SIMS, to the real chemistries in the back of the good fortune of the strategy, in addition to the wide-ranging purposes of the know-how. Examples of topics coated contain:

  • Cluster SIMS thought and modeling
  • Cluster ion resource kinds and function expectations
  • Cluster ion beams for floor research experiments
  • Molecular intensity profiling and 3-D research with cluster ion beams
  • Specialty purposes starting from organic samples research to semiconductors/metals analysis
  • Future demanding situations and clients for cluster SIMS

This booklet is meant to profit any scientist, starting from commencing to complex in point, with lots of figures to assist larger comprehend complicated suggestions and tactics. furthermore, every one bankruptcy ends with an in depth reference set to the first literature, facilitating extra examine into person subject matters the place wanted. Cluster Secondary Ion Mass Spectrometry: rules and Applications is a must have learn for any researcher within the floor research and/or imaging mass spectrometry fields.Content:
Chapter 1 An advent to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS) (pages 1–11): Christine M. Mahoney and Greg Gillen
Chapter 2 Cluster SIMS of natural fabrics: Theoretical Insights (pages 13–55): Arnaud Delcorte, Oscar A. Restrepo and Bartlomiej Czerwinski
Chapter three Ion assets Used for Secondary Ion Mass Spectrometry (pages 57–75): Albert J. Fahey
Chapter four floor research of natural fabrics with Polyatomic basic Ion resources (pages 77–116): Christine M. Mahoney
Chapter five Molecular intensity Profiling with Cluster Ion Beams (pages 117–205): Christine M. Mahoney and Andreas Wucher
Chapter 6 Three?Dimensional Imaging with Cluster Ion Beams (pages 207–246): Andreas Wucher, Gregory L. Fisher and Christine M. Mahoney
Chapter 7 Cluster Secondary Ion Mass Spectrometry (SIMS) For Semiconductor and Metals intensity Profiling (pages 247–268): Greg Gillen and Joe Bennett
Chapter eight Cluster TOF?SIMS Imaging and the Characterization of organic fabrics (pages 269–312): John Vickerman and Nick Winograd
Chapter nine destiny demanding situations and clients of Cluster SIMS (pages 313–327): Peter Williams and Christine M. Mahoney

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0 ps. Color coding of the molecules: red is for the top layer, pink for the intermediate layer, and orange for the bottom layer. 49 Spatial distribution of original location of (a) molecular fragments and (b) C6 H6 molecules sputtered by 15-keV Ga and 15-keV C60 impacts at normal incidence. The color represents the number of species emitted per ˚ 2 . ” Each pixel corresponds to an area of 4 × 4 A with permission from ACS publications. 11 Off-normal emission. Angular distribution of C6 H6 molecules ejected under 15-keV Ga (black) and 15-keV C60 (red) bombardment at normal incidence.

2b). For cluster impacts, the BCA-based simulation codes, treating only one-to-one collisions in a sequential manner, must be replaced by another scheme that is able to adequately model interactions between many partners at each time, such as MD simulations. In the late stages of the interaction, when the energy of the projectile and recoil atoms is of the order of magnitude of the bond energies in the solid, the organic sample behaves like the classical beads-and-spring system. Predicting the details of these late events, in which fragments and entire molecules are emitted from organic surfaces, requires a realistic description of many-body interactions for both atomic and cluster bombardment.

4 eV) binding energy, makes their ejection possible even via the less energetic processes initiated by the Ga impact. Second, the aforementioned pressure wave induced by C60 pushes molecules away from the impact point (Fig. 9). Finally, the stronger interaction of C60 with the organic layer induces significantly more fragmentation. Combining these explanations, one can conclude that during C60 cluster bombardment, small physisorbed molecules will be rather fragmented or pushed away from sputtering region than ejected intact.

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