Handbook of Microscopy Set: Applications in Materials by S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van

By S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo

Accomplished in insurance, written and edited through major specialists within the box, this guide is a definitive, updated reference paintings. The Volumes tools I and strategies II element the physico-chemical foundation and features of some of the microscopy innovations utilized in fabrics technological know-how. the amount functions illustrates the implications acquired by way of all on hand tools for the most sessions of fabrics, displaying which process might be effectively utilized to a given fabric for you to receive the specified information.

With the guide of Microscopy, scientists and engineers considering fabrics characterization should be capable of resolution key questions: "How does a given process work?", and "Which techique is appropriate for characterizing a given material?"

Chapter 1 Metals and Alloys (pages 5–110):
Chapter 2 Microscopy of Rocks and Minerals (pages 111–144):
Chapter three Semiconductors and Semiconductor units (pages 145–205):
Chapter four Optoelectronic fabrics (pages 207–233):
Chapter five area constructions in Ferroic fabrics (pages 235–251):
Chapter 6 Microscopy of Structural Ceramics (pages 253–292):
Chapter 7 Microscopy of Gemmological fabrics (pages 293–320):
Chapter eight Superconducting Ceramics (pages 321–383):
Chapter nine Non?Periodic buildings (pages 385–410):
Chapter 10 scientific and Dental fabrics (pages 411–436):
Chapter eleven Carbon (pages 437–482):
Chapter 12 Composite Structural fabrics (pages 483–506):
Chapter thirteen The constitution of Polymers and Their Monomeric Analogs (pages 507–582):
Chapter 14 Nuclear fabrics (pages 583–664):
Chapter 15 Magnetic Microscopy (pages 665–687):
Chapter 1 Small debris (pages 691–737):
Chapter 2 Structural section modifications (pages 739–750):
Chapter three training innovations for Transmission Electron Microscopy (pages 751–801):
Chapter four Environmental difficulties (pages 803–819):
Chapter five Quantitative Hyleography: The selection of Quantitative information from Micrographs (pages 821–833):
Chapter 1 basics of sunshine Microscopy (pages 7–31):
Chapter 2 Optical Contrasting of Microstructures (pages 33–53):
Chapter three Raman Microscopy (pages 55–69):
Chapter four Three?Dimensional mild Microscopy (pages 71–82):
Chapter five close to box Optical Microscopy (pages 83–96):
Chapter 6 Infrared Microscopy (pages 97–115):
Chapter 1 delicate X?Ray Imaging (pages 119–129):
Chapter 2 X?Ray Microradiography (pages 149–161):
Chapter three X?Ray Microtomography (pages 149–161):
Chapter four gentle X?Ray Microscopy through Holography (pages 163–176):
Chapter five X?Ray Diffraction Topography (pages 195–241):
Chapter 1 Acoustic Microscopy (pages 194–241):
Chapter 1.1 desk bound Beam tools: Transmission Electron Microscopy (pages 246–351):
Chapter 1.1.2 High?Resolution Electron Microscopy (pages 353–406):
Chapter 1.2 mirrored image Electron Microscopy (pages 407–424):
Chapter 1.3 Electron Energy?Loss Spectroscopy Imaging (pages 425–445):
Chapter 1.4 excessive Voltage Electron Microscopy (pages 447–465):
Chapter 1.5 Convergent Beam Electron Diffraction (pages 467–485):
Chapter 1.6 Low?Energy Electron Microscopy (pages 487–503):
Chapter 1.7 Lorentz Microscopy (pages 505–514):
Chapter 1.8 Electron Holography tools (pages 515–536):
Chapter 2.1 Scanning Electron Microscopy (pages 539–561):
Chapter 2.2 Scanning Transmission Electron Microscopy (pages 563–594):
Chapter 2.3 Scanning Transmission Electron Microscopy: Z distinction (pages 595–620):
Chapter 2.4 Scanning Auger Microscopy (SAM) and Imaging X?Ray Photoelectron Spectroscopy (XPS) (pages 621–640):
Chapter 2.5 Scanning Microanalysis (pages 641–659):
Chapter 2.6 Imaging Secondary Ion Mass Spectrometry (pages 691–716):
Chapter 1 Nuclear Magnetic Resonance (pages 719–734):
Chapter 2 Scanning Electron Microscopy with Polarization research (SEMPA) (pages 735–749):
Chapter three Spin?Polarized Low?Energy Electron Microscopy (pages 751–759):
Chapter 1 Photoelectron Emission Microscopy (pages 763–773):
Chapter 2 box Emission and box Ion Microscopy (Including Atom Probe FIM) (pages 775–801):
Chapter 1 Scanning Tunneling Microscopy (pages 809–826):
Chapter 2 Scanning strength Microscopy (pages 828–844):
Chapter three Magnetic strength Microscopy (pages 845–853):
Chapter four Ballistic Electron Emission Microscopy (pages 855–882):
Chapter 1 photo Recording in Microscopy (pages 885–921):
Chapter 2 snapshot Processing (pages 923–952):
Chapter 1 twist of fate Microscopy (pages 955–962):
Chapter 2 Low strength Electron Holography and Point?Projection Microscopy (pages 963–986):

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Additional resources for Handbook of Microscopy Set: Applications in Materials Science, Solid-State Physics and Chemistry: Vols. 1+2+3

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